Yanyun Tao;   Wenhao Yuan;   Jiajun Lin;   Minglu Li;   
Sch. of Electron. Inf. & Electr. Eng., Shanghai JiaoTong Univ., Shanghai, China   This paper appears in: Computational Intelligence and Software Engineering (CiSE), 2010 International Conference on
Issue Date: 10-12 Dec. 2010
On page(s): 1 - 5
Location: Wuhan
Print ISBN: 978-1-4244-5391-7
References Cited: 12
INSPEC Accession Number: 11706787
Digital Object Identifier: 10.1109/CISE.2010.5677035  
Date of Current Version: 30 十二月 2010
http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5677035