For a manufacturing activity to remain competitive, engineers must rigorously apply statistics methodologies that enable them to understand the sources and consequences of uncontrolled process variation. In this example-rich text, author Jack Reece explains simple comparative statistics and demonstrates how to use JMP to examine raw data graphically and to generate regression models involving fixed and random effects. The following major topics are addressed:

* Characterizing the measurement process
* Analyzing process performance
* Developing appropriate control mechanisms for monitoring measurement and performance

Although many of the examples rely on case studies, largely in the semiconductor manufacturing area, the principles described and the methods used apply generally to the study of any process or manufacturing activity. This book assumes that the reader has some knowledge of JMP software, but does not assume extensive statistical knowledge.