Particle Technology Series
Volume 172009
Particle Size MeasurementsFundamentals, Practice, QualityAuthors:
ISBN: 978-1-4020-9015-8 (Print) 978-1-4020-9016-5 (Online)
Fundamentals, Practice, Quality
Series:
Particle Technology Series, Vol. 17
Merkus, Henk G.
2009, XII, 536 p.
ISBN 978-1-4020-9016-5
Immediately available per PDF-download (no DRM, watermarked)
About this book
- The essential practical guide to particle size analysis techniques
- Equally useful to experienced practitioners and novices
This book focuses on the practical aspects of particle size measurement: a major difference with existing books, which have a more theoretical approach. Of course, the emphasis still lies on the measurement techniques. For optimum application, their theoretical background is accompanied by quantitative quality aspects, limitations and problem identification. In addition the book covers the phenomena of sampling and dispersion of powders, either of which may be dominant in the overall analysis error. Moreover, there are chapters on the general aspects of quality for particle size analysis, quality management, reference materials and written standards, in- and on-line measurement, definitions and multilingual terminology, and on the statistics required for adequate interpretation of results. Importantly, a relation is made to product performance, both during processing as well as in final application.
In view of its set-up, this book is well suited to support particle size measurement courses.
Table of contents Preface
1. Introduction
2. Particle size, size distributions and shape
3. Quality aspects in particulate analysis
4. Sampling
5. Dispersion
6. Overview of size characterization methods
7. Microscopy and image analysis
8. Sieving
9. Electrical sensing zone
10. Laser diffraction
11. Ultrasound extinction
12. Dynamic light scattering
13. Sedimentation; 13.1 Gravitational sedimentation; 13.2 Centrifugal sedimentation; 13.3 Sedimentation field flow fractionation
14. In- and on-line measurement
15. Written standards
16. Reference materials
17. Quality management and calibration
18. Definitions and symbols
19. Multilingual terminology
20. Statistical background
Annex I. Names and addresses of institutes and companies
Subject index
The author has been working at the Delft University of Technology for about 35 years, the last 20 years of it in Particle Characterization in the Particle Technology Group of prof. Brian Scarlett. Also, for about 15 years he has been a member of ISO/TC24 on Sieving and Other Methods for Particle Size Measurement and he still is. Retired now the author is active in giving courses on this subject, in the Netherlands as well as in Sweden and the United Kingdom.