*名称：Handbook of Statistics Vol 22（Statistics in Industry ）
*大小：59.8M
*格式：PDF
*目录，
1.  
 Preface
Pages v-vii
Ravindra Khattree, C. Radhakrishna Rao
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 2.  
 Contributors
Pages xix-xxi
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 Part I. Statistics in Research and Development
 3.  
 Ch. 1. Guidelines for selecting factors and factor levels for an industrial designed experiment
Pages 3-32
Veronica Czitrom
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 4.  
 Ch. 2. Industrial experimentation for screening
Pages 33-73
Dennis K.J. Lin
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 5.  
 Ch. 3. The planning and analysis of industrial selection and screening experiments
Pages 75-129
Guohua Pan, Thomas J. Santner, David M. Goldsman
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 6.  
 Ch. 4. Uniform experimental designs and their applications in industry
Pages 131-170
Kai-Tai Fang, Dennis K.J. Lin
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 7.  
 Ch. 5. Mixed models and repeated measures: Some illustrative industrial examples
Pages 171-207
George A. Milliken
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 8.  
 Ch. 6. Current modeling and design issues in response surface methodology: GLMs and models with block effects
Pages 209-229
André I. Khuri
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 9.  
 Ch. 7. A review of design and modeling in computer experiments
Pages 231-261
Victoria C.P. Chen, Kwok-Leung Tsui, Russell R. Barton, Janet K. Allen
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 10.  
 Ch. 8. Quality improvement and robustness via design of experiments
Pages 263-317
Bruce E. Ankenman, Angela M. Dean
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 11.  
 Ch. 9. Software to support manufacturing experiments
Pages 319-457
Jack E. Reece
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 12.  
 Ch. 10. Statistics in the semiconductor industry
Pages 459-498
Veronica Czitrom
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 13.  
 Ch. 11. Predict: A new approach to product development and lifetime assessment using information integration technology
Pages 499-522
Jane M. Booker, Thomas R. Bement, Mary A. Meyer, William J. Kerscher III
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 14.  
 Ch. 12. The promise and challenge of mining web transaction data
Pages 523-549
S.R. Dalal, D. Egan, Y. Ho, M. Rosenstein
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 Part II. Statistics in On-Line Industrial Processes
 15.  
 Ch. 13. Control chart schemes for monitoring the mean and variance of processes subject to sustained shifts and drifts
Pages 553-571
Zachary G. Stoumbos, Marion R. Reynolds Jr., William H. Woodall
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 16.  
 Ch. 14. Multivariate control charts: Hotelling T2, data depth and beyond
Pages 573-593
Regina Y. Liu
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 17.  
 Ch. 15. Effective sample sizes for T2 control charts
Pages 595-607
Robert L. Mason, Youn-Min Chou, John C. Young
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 18.  
 Ch. 16. Multidimensional scaling in process control
Pages 609-623
Trevor F. Cox
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 19.  
 Ch. 17. Quantifying the capability of industrial processes
Pages 625-656
Alan M. Polansky, S.N.U.A. Kirmani
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 20.  
 Ch. 18. Taguchi's approach to on-line control procedure
Pages 657-694
M.S. Srivastava, Yanhong Wu
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 21.  
 Ch. 19. Dead-band adjustment schemes for on-line feedback quality control
Pages 695-727
Alberto Luceño
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 Part III. Measurement Processes
 22.  
 Ch. 20. Statistical calibration and measurements
Pages 731-764
Hari Iyer
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 23.  
 Ch. 21. Subsampling designs in industry: Statistical inference for variance components
Pages 765-794
Ravindra Khattree
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 24.  
 Ch. 22. Repeatability, reproducibility and interlaboratory studies
Pages 795-822
Ravindra Khattree
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 25.  
 Ch. 23. Tolerancing — Approaches and related issues in industry
Pages 823-865
Tiru S. Arthanari
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 Part IV. Statistical Inferential Techniques Useful in Industrial Applications
 26.  
 Ch. 24. Goodness-of-fit tests for univariate and multivariate normal models
Pages 869-906
Deo Kumar Srivastava, Govind S. Mudholkar
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 27.  
 Ch. 25. Normal theory methods and their simple robust analogs for univariate and multivariate linear models
Pages 907-956
Deo Kumar Srivastava, Govind S. Mudholkar
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 28.  
 Ch. 26. Diagnostic methods for univariate and multivariate normal data
Pages 957-993
Dayanand N. Naik
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 29.  
 Ch. 27. Dimension reduction methods used in industry
Pages 995-1039
Giovanni Merola, Bovas Abraham
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 30.  
 Ch. 28. Growth and wear curves
Pages 1041-1054
Anant M. Kshirsagar
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 31.  
 Ch. 29. Time series in industry and business
Pages 1055-1106
B. Abraham, N. Balakrishna
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 Part V. Software Reliability
 32.  
 Ch. 30. Stochastic process models for reliability in dynamic environments
Pages 1109-1129
Nozer D. Singpurwalla, Thomas A. Mazzuchi, Süleyman Özekici, Refik Soyer
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 33.  
 Ch. 31. Bayesian inference for the number of undetected errors
Pages 1131-1150
Sanjib Basu
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 34.  
 Subject index
Pages 1151-1164
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 35.  
 Handbook of statistics contents of previous volumes
Pages 1165-1187
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