英文文献：Modeling Multivariate Crop Yield Densities With Frequent Extreme Events
英文文献作者：Chen, Shu-Ling,Miranda, Mario J.
英文文献摘要：
Measuring the lower tail of a crop yield distribution is important for managing agricultural production risk and rating crop insurance. Common parametric techniques encounter difficulties when attempting to model extreme yield events. We evaluate and compare alternative models based on our candidate distributions for high risk counties.