【作者(必填)】J. J. M. Zaal, W. D. van Driel, F. J. H. G. Kessels and G. Q. Zhang

【文题(必填)】Correlating Drop Impact Simulations With Drop Impact Testing Using High-Speed Camera Measurements
【年份(必填)】2009

【全文链接或数据库名称(选填)】http://electronicpackaging.asmed ... x?articleid=1409210