1. Uniformity pattern and related criteria for two-level factorials
http://springer.lib.tsinghua.edu.cn/content/w0230mk16r360242/?p=a79191c6f3854642bbea8a6ae279c9b2&pi=23
2.
Lower bounds of various discrepancies on combined designs
期刊 | Metrika |
出版社 | Physica Verlag, An Imprint of Springer-Verlag GmbH |
ISSN | 0026-1335 (Print) 1435-926X (Online) |
DOI | 10.1007/s00184-009-0292-x |
学科分类 | 数学和统计学 |
http://springer.lib.tsinghua.edu.cn/content/v8362451hj6246gl/?p=8f3399a3fb90419d80623d39f197dcf8&pi=15
3.
Uniformity pattern and related criteria for two-level factorials
http://springer.lib.tsinghua.edu.cn/content/w0230mk16r360242/?p=1b10520a8c9b469b91ea6bdc9390c508&pi=23