【作者(必填)】Smith, L. Vanessa
Leybourne, Stephen
Kim, Tae-Hwan
Newbold, Paul

【文题(必填)】More powerful panel data unit root tests with an application to mean reversion in real exchange rates

【年份(必填)】2004

【全文链接或数据库名称(选填)】http://onlinelibrary.wiley.com/doi/10.1002/jae.723/abstract