【作者(必填)】
Ren-Hua Zhang ; Inst. of Geophys. Sci., Chinese Acad. of Sci., Beijing ; Jing Tian ; Hong-Bo Su ; Xiao-Ming Sun
【文题(必填)】
A measuring device for studying scaling of emissivities from sub-pixel to pixel
【年份(必填)】
2006
【全文链接或数据库名称(选填)】http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=4241679&abstractAccess=no&userType=inst