1. B Clemens,AS Foster,CR Henry,AL Shluger, “Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods”, Advanced Materials, 2011, 23(4):477-501 (译文)
2. Giessibl, Franz J. (2003). "Advances in atomic-force microscopy". Reviews of Modern Physics 75 (3): 949–983.
3. J Binnig, G.; Quate, C. F.; Gerber, C. (1986). "Atomic-Force Microscope". Physical Review Letters 56: 930–933.
4. R. Proksch and S. Kalinin, Piezoresponse Force Microscopy with Asylum Research APP note 10.
5. Melitz, Wilhelm; Shen, Jian; Kummel, Andrew C.; Lee, Sangyeob (2011). "Kelvin probe force microscopy and its application". Surface Science Reports 66 (1): 1–27
6. M. Nonnenmacher, M. P. O'Boyle, and H. K. Wickramasinghe (1991). "Kelvin probe force microscopy". Appl. Phys. Lett. 58 (25): 2921.
7. K. Kitamura, Y. Furukawa, K. Niwa, V. Gopalan and T. E. Mitchell, Appl. Phys. Lett., 73, 3073 (1998).
8. X. Liu, K. Kitamura and K. Terabe, Appl. Phys. Lett. 89, 132905 (2006).
9. X. Liu, K. Kitamura, K. Terabe, H. zeng and Q. Yin, Appl. Phys. Lett. 91, 232913 (2007)