Simulation of drop/impact reliability for electronic devices

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收藏 2020-06-20

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【作者(必填)】[size=0.875] [url=]

Y. Y. Wang[/url]

,[size=0.875] [url=]

C. Lu[/url]

,[size=0.875] [url=]

J. Li[/url]

,[size=0.875] [url=]

X. M. Tan[/url]

,[size=0.875] [url=]

Y. C. Tse[/url]

【文题(必填)】Simulation of drop/impact reliability for electronic devices
【年份(必填)】2005

【全文链接或数据库名称(选填)】https://dl.acm.org/doi/10.5555/1063344.1707893

1-s2.0-S0168874X04001647-main.Simulation of dropimpact reliability for electronic devices.pdf: https://545c.com/file/9471382-449811260

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2020-6-20 22:46:26

1-s2.0-S0168874X04001647-main.Simulation of dropimpact reliability for electronic devices.pdf:
https://545c.com/file/9471382-449811260

请注明：姓名-公司-职位

以便审核进群资格，未注明则拒绝

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