摘要翻译：
Ptychography是相干衍射成像的一种形式，利用短波（如X射线、电子束）来实现高分辨率的图像重建。对照明探头位置的准确认识是影响重建质量的一个限制因素。近年来，人们在降低对探头位置精度的要求方面取得了许多进展。在这里，我们分析和演示了一种直接的方法，可以用来校正探针位置的亚像素精度。本文给出了可见光下的模拟和实验结果。
---
英文标题：
《Lateral position correction in ptychography with sub-pixel accuracy》
---
作者：
P. Dwivedi, A.P. Konijnenberg, S.F. Pereira, and H.P. Urbach
---
最新提交年份：
2018
---
分类信息：

一级分类：Electrical Engineering and Systems Science        电气工程与系统科学
二级分类：Image and Video Processing        图像和视频处理
分类描述：Theory, algorithms, and architectures for the formation, capture, processing, communication, analysis, and display of images, video, and multidimensional signals in a wide variety of applications. Topics of interest include: mathematical, statistical, and perceptual image and video modeling and representation; linear and nonlinear filtering, de-blurring, enhancement, restoration, and reconstruction from degraded, low-resolution or tomographic data; lossless and lossy compression and coding; segmentation, alignment, and recognition; image rendering, visualization, and printing; computational imaging, including ultrasound, tomographic and magnetic resonance imaging; and image and video analysis, synthesis, storage, search and retrieval.
用于图像、视频和多维信号的形成、捕获、处理、通信、分析和显示的理论、算法和体系结构。感兴趣的主题包括：数学，统计，和感知图像和视频建模和表示；线性和非线性滤波、去模糊、增强、恢复和重建退化、低分辨率或层析数据；无损和有损压缩编码；分割、对齐和识别；图像渲染、可视化和打印；计算成像，包括超声、断层和磁共振成像；以及图像和视频的分析、合成、存储、搜索和检索。
--
一级分类：Physics        物理学
二级分类：Instrumentation and Detectors        仪器仪表和探测器
分类描述：Instrumentation and Detectors for research in natural science, including optical, molecular, atomic, nuclear and particle physics instrumentation and the associated electronics, services, infrastructure and control equipment.
用于自然科学研究的仪器和探测器，包括光学、分子、原子、核和粒子物理仪器和相关的电子学、服务、基础设施和控制设备。
--

---
英文摘要：
  Ptychography, a form of Coherent Diffractive Imaging, is used with short wavelengths (e.g. X-rays, electron beams) to achieve high-resolution image reconstructions. One of the limiting factors for the reconstruction quality is the accurate knowledge of the illumination probe positions. Recently, many advances have been made to relax the requirement for the probe positions accuracy. Here, we analyze and demonstrate a straightforward approach that can be used to correct the probe positions with sub-pixel accuracy. Simulations and experimental results with visible light are presented in this work.
---
PDF链接：
https://arxiv.org/pdf/1803.11454