摘要翻译：
文献[HY]中引入的广义检验理想通过归约到特征P与乘子理想有关。此外，它们满足乘子理想的许多微妙性质，这些性质在特征零中遵循消失定理。在本文中，我们给出了几个例子来强调检验理想和乘子理想的不同行为。我们的主要结果是F-有限正则局部环中的每个理想都可以写成广义检验理想。我们还证明了$F$-纯阈值的半连续性（尽管类似于乘子理想的一般限制定理不成立）。
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英文标题：
《Test ideals vs. multiplier ideals》
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作者：
Mircea Mustata and Ken-ichi Yoshida
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最新提交年份：
2008
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分类信息：

一级分类：Mathematics        数学
二级分类：Commutative Algebra        交换代数
分类描述：Commutative rings, modules, ideals, homological algebra, computational aspects, invariant theory, connections to algebraic geometry and combinatorics
交换环，模，理想，同调代数，计算方面，不变理论，与代数几何和组合学的联系
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一级分类：Mathematics        数学
二级分类：Algebraic Geometry        代数几何
分类描述：Algebraic varieties, stacks, sheaves, schemes, moduli spaces, complex geometry, quantum cohomology
代数簇，叠，束，格式，模空间，复几何，量子上同调
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英文摘要：
  The generalized test ideals introduced in [HY] are related to multiplier ideals via reduction to characteristic p. In addition, they satisfy many of the subtle properties of the multiplier ideals, which in characteristic zero follow via vanishing theorems. In this note we give several examples to emphasize the different behavior of test ideals and multiplier ideals. Our main result is that every ideal in an F-finite regular local ring can be written as a generalized test ideal. We also prove the semicontinuity of $F$-pure thresholds (though the analogue of the Generic Restriction Theorem for multiplier ideals does not hold).
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PDF链接：
https://arxiv.org/pdf/0706.1124